Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers
Diego P. Oyarzún, Omar E. Linarez Pérez, Manuel López Teijelo, César Zúñiga, Eduardo Jeraldo, Daniela A. Geraldo, Ramiro Arratia-Perez
Research output: Contribution to journal › Article › peer-review
21Scopus
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