Reliability and risk analysis under peaks over a random threshold value-at-risk method based on a new flexible skew-logistic distribution

Morad Alizadeh, P. J. Hazarika, Jondeep Das, Javier E. Contreras-Reyes, G. G. Hamedani, Piotr Sulewski, Haitham M. Yousof

Research output: Contribution to journal › Article › peer-review

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